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Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy
Remarks Applications Electron Spectroscopy
2010/9/17
The quantification of results of electron spectroscopies, AES and XPS, requires knowledge of the inelastic mean free path (IMFP) of signal electrons in solids. This parameter determines the surface s...
Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy
Effects Electron Back-scattering Observations Cross-sectioned GaAs/AlAs Superlattice Auger Electron Spectroscopy
2010/9/17
Cross-sections of GaAs/AlAs thin films prepared by cleavage of MBE-grown superlattices have been analyzed with Auger electron spectroscopy with a spatial resolution of 6 nm. Elemental distributions o...
Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy-Loss Spectroscopy and Elastic Peak Electron Spectroscopy
Surface Electron Spectroscopies Reflection Electron Energy-Loss Spectroscopy Elastic Peak Electron Spectroscopy
2010/9/17
Surface excitations, in addition to bulk excitation, undergone by signal electrons in surface electron spectroscopies, such as Auger electron spectroscopy, and X-ray photoelectron spectroscopy, play a...
Electron Spectroscopy for Material Characterization
Electron Spectroscopy Material Characterization
2010/6/30
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characteriz...